Figure 1. Piezoelectric Oven Lighter Powered EMI Source
(contributed by Edward Witte for this article)
Abstract: An easy to build and use EMI generator designed by Edward Witte is described. "Home brew" test equipment such as this can be very useful in troubleshooting equipment problems.
Discussion:
Simple to build and use test equipment can be some of the most useful in
troubleshooting equipment in the lab. Figure 1 shows an example of
such an instrument. The design is related to the Static
Field Powered EMI Source
described in the June 2001 Technical Tidbit on this website. In this case,
instead of static charge generating the spark, the voltage is provided by
a piezoelectric oven lighter. Just squeezing the handle generates multiple sparks
and the resultant EMI.
In Ed's original design, a 4 mm spark gap was used. If the spark gap is made smaller,
the risetime of the radiated fields will become significantly faster. The
fraction of a mm gap in the
Static
Field Powered EMI Source
yields risetimes on the order of 300 ps. The radiated fields will have a
damped oscillatory form with the frequency related to the length of the copper
strips for both designs.
The
Static Field Powered EMI Source
from the June 2001 Technical Tidbit can produce hundreds of sparks quickly
as a static charge (on a plastic cup, for instance) is passed back and forth
over the spark gap while being held close to the copper foil. The automatic,
Pulsed Field ESD Simulator (~440 kB pdf file)
from Fischer Custom communications produces tens of impulses per second with
~200 ps risetimes. Ed finds that his EMI generator, shown in Figure 1, produces
about 5 sparks per squeeze of the handle. After he reduced the spark gap
from 4 mm to ~0.5 mm, each squeeze of the handle produced hundreds of sparks.
Each of these instruments has its advantages.
Summary:
This simple home built accessory
can be a useful addition to a test lab, providing a low cost troubleshooting
tool. Many examples of simple test accessories, such as this one, can
be found on this website.