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Figure 1. Square Loop Measurement of Chip Package Noise
Abstract: Voltage drops in chip packages can cause significant
signal integrity and EMC problems. The good news is that in many cases these
voltages can be measured through mutual inductance. Measured results and
their interpretation are discussed.
Figure 2 shows a pulse recorded from a package similar in appearance and size to the one shown in Figure 1. The
impulse shown in Figure 2 was an isolated pulse with very low duty cycle.
Notice the peak value of about 125 mV. If the coupling of the voltage drop
in the package to the loop is 25% (a typical value) then the voltage drop
in the package is about 500 mV! This is enough to be cause for concern and
its effect on the signal integrity of the chip should be investigated as
outlined in the paper referenced above. In general, the effects on signal
integrity of a loop output of more than 50 mV should be investigated.
Conclusion: Useful information can be obtained from relatively
simple measurement techniques. The data above clearly shows detection of
possible signal integrity and EMC problems in a chip package by just looking
at the output from a square loop held against the chip package.
References:
The data in the waveforms above was taken with an Agilent Infinium 54845a oscilloscope.
There is much that can be said about the above data and
this measurement technique that is not included here because of space limitations.
More detailed information will be published on this topic and others in white
papers on this website in the future. A demonstration of this effect has been recently added to my seminars.